Electron Devices

Fundamentals of Carrier Transport

Fundamentals of Carrier Transport explores the behavior of charged carriers in semiconductors and semiconductor devices for readers without an extensive background in quantum mechanics and solid-state physics. This second edition contains many new and updated sections, including a completely new chapter on transport in ultrasmall devices and coverage of "full band" transport. Lundstrom also covers both low- and high-field transport, scattering, transport in devices, and transport in mesoscopic systems. He explains in detail the use of Monte Carlo simulation methods and provides many homework exercises along with a variety of worked examples. What makes this book unique is its broad theoretical treatment of transport for advanced students and researchers engaged in experimental semiconductor device research and development.

Fundamentals of Carrier Transport is an accessible introduction to the behavior of charged carriers in semiconductors and semiconductor devices. It is written specifically for engineers and students without an extensive background in quantum mechanics and solid-state physics. This second edition contains many new and updated sections, including a completely new chapter on transport in ultrasmall devices. The book will be of great interest to graduate students of electrical engineering and applied physics. It will also be invaluable to practising engineers working on semiconductor device research and development.

Foundations Of Electronics Circuits & Devices (Electron Flow Version)

Foundations of Electronics: Circuits and Devices, 5E includes the same superior content and readability as Foundations of Electronics, 5E, plus strong coverage of solid-state devices theory and important practical circuits in which diodes, BJT's, FET's, MOSFET's and optoelectronic devices are used. The Fifth Edition has been updated to better provide a foundation in power supplies, amplifiers, oscillators, op-amps, and optoelectronic systems that readers need to launch a career or pursue more advanced study. Real-world color codes and strategic highlighting combine with color charts, photos, schematics, and diagrams to foster a solid foundation in circuits and devices that bridges the gap between must-know theory and hands-on circuit work. Other enhancements include totally new, automated calculations for the formulas in the book on the accompanying CD, and all-new information on admittance and susceptance.

Electron Physics of Vacuum and Gaseous Devices

An excellent text/reference that describes the fundamentals of electron physics. Presents working principles for diverse tubes and devices and includes technical data which demonstrates the state of art and use in possible applications. Although solid state has replaced old electron tubes in many electronic devices, electronic tubes and instruments are still important in vacuum technology, electron accelerators and microscopes, devices using free charged particles and microwaves. This book provides a comprehensive treatment of the physics behind this technology.

High-Energy Electron Diffraction and Microscopy (Monographs on the Physics and Chemistry of Materials, 61)

This book provides the reader with a comprehensive introduction to high-energy electron diffraction and elastic and in elastic scattering of high-energy electrons, with particular emphasis on application to modern electron microscopy. Starting from a survey of fundamental phenomena, we introduce the most important concepts underlying modern understanding of high-energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework or the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarized in tables including those of electron scattering factors for all neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.

Electron Beam Analysis of Materials

The second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis available today.

Functional Thin Films and Functional Materials: New Concepts and Technologies (Springer Series in Materials Science)

This book provides an up-to-date introduction to the field of functional thin films and materials, encompassing newly developed technologies and fundamental new concepts. The focus is on the critical areas of novel thin films such as sol gel synthesis of membrane, ferroelectric thin films and devices, functional nanostructured thin films, micromechanical analysis of fiber-reinforced composites, and novel applications. An important aspect of the book lies in its wide coverage of practical applications. It introduces not only the cutting-edge technologies in modern industry, but also unique applications in many rapidly advancing fields. This book is written for a wide readership including university students and researchers from diverse backgrounds such as physics, materials science, engineering and chemistry. Both undergraduate and graduate students will find it a valuable reference book on key topics related to solid state and materials science.

Handbook of Charged Particle Optics

This timely handbook contains chapters on the essential elements of high resolution charged particle optics and is written by many of the worlds leading research scientists. It is a complete guide to understanding, designing, and using high resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This handbook is evenly balanced between theory and application, and covers all the most important topics in this growing area. Handbook of High Resolution Charged Particle Optics explains how and why high resolution instruments work and how to apply this information when designing or using them.

Wide Bandgap Semiconductors: Fundamental Properties and Modern Photonic and Electronic Devices

This book offers a comprehensive overview of the development, current state and future prospects of wide bandgap semiconductor materials and related optoelectronics devices. It includes an overview of recent developments in III-V nitride semiconductors, SiC, diamond, ZnO, II-VI materials and related devices including AIGaN/GaN FET, UV LDs, white light LEDs, and cold electron emitters.

With 901 references, 333 figures and 21 tables, this book will serve as a one-stop source of knowledge on wide bandgap semiconductors and related optoelectronics devices.

After reviue of the basic physics of WBGS and the relevance of the physical properties to the development of commercial devices, the book addresses the applications of WBGS devices for solid-state white-light illumination, medicine and gigahertz-high power telecommunications. In addition, description of recent development in the growth and applications of nitride semiconductors are complemented by chapters on the properties and device applications of SiC, diamond thin films, doping of ZnO, II-IVs and the novel BeZnSeTe/BAlGaAs material systems. Practical issues and problems such as the effect of defects on device performance are highlighted and solutions proposed based on recent studies.

Vertical-Cavity Surface-Emitting Laser Devices

Vertival-cavity surface-emitting lasers (VCSELs) are one of the most promising new developments in laser physics. Covering such a wide range of topics such as operation principles, design considerations and performance measurements, this book is the first of its kind in that it provides readers with a comprehensive account of the latest technological developments in VCSEL devices. In fact, all the chapters are written by pioneers and key experts who have exclusive access to the most up-to-date innovations in the respective fields. Readers will come to appreciate to all the crucial aspects of VCSEL devices. Theories and simulations as well as experiments are discussed in the book.

Electron Microprobe Analysis

This book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.

This book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the first edition, which was regarded as a standard work on the subject. The design and operation of the instrument are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed.